• DocumentCode
    2656572
  • Title

    Solving ESD protection latch-up guard ring issues during electrostatic discharge (ESD) events

  • Author

    Trémouilles, David ; Bafleur, Marise ; Bertrand, Géraldine ; Nolhier, Nicolas ; Mauran, Nicolas ; Lescouzeres, Lionel

  • Author_Institution
    LAAS, CNRS, Toulouse, France
  • fYear
    2003
  • fDate
    28-30 Sept. 2003
  • Firstpage
    133
  • Lastpage
    136
  • Abstract
    In this paper, we show how latch-up guard rings, surrounding electrostatic discharge (ESD) protection devices, can reduce the overall performance of the ESD protection network. This issue is addressed by TCAD simulation and experimental results. Design guidelines to cope with this problem are proposed.
  • Keywords
    circuit simulation; electrostatic discharge; protection; semiconductor device testing; technology CAD (electronics); ESD protection device; ESD protection network; TCAD simulation; electrostatic discharge; latch-up guard ring; Electrostatic discharges; Protection; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the
  • ISSN
    1088-9299
  • Print_ISBN
    0-7803-7800-8
  • Type

    conf

  • DOI
    10.1109/BIPOL.2003.1274952
  • Filename
    1274952
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2656572