Title :
Solving ESD protection latch-up guard ring issues during electrostatic discharge (ESD) events
Author :
Trémouilles, David ; Bafleur, Marise ; Bertrand, Géraldine ; Nolhier, Nicolas ; Mauran, Nicolas ; Lescouzeres, Lionel
Author_Institution :
LAAS, CNRS, Toulouse, France
Abstract :
In this paper, we show how latch-up guard rings, surrounding electrostatic discharge (ESD) protection devices, can reduce the overall performance of the ESD protection network. This issue is addressed by TCAD simulation and experimental results. Design guidelines to cope with this problem are proposed.
Keywords :
circuit simulation; electrostatic discharge; protection; semiconductor device testing; technology CAD (electronics); ESD protection device; ESD protection network; TCAD simulation; electrostatic discharge; latch-up guard ring; Electrostatic discharges; Protection; Semiconductor device testing;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the
Print_ISBN :
0-7803-7800-8
DOI :
10.1109/BIPOL.2003.1274952
