Title :
Multi-port ESD protection using bi-directional SCR structures
Author :
Vaschenko ; Concannon, A. ; Beek, M. Ter ; Hopper, P.
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
Abstract :
A novel approach for the ESD protection of analog circuits using a pad-to-pad network is proposed and validated by numerical simulation and experimental data. The network is formed by inter-linked bi-directional SCR´s. This network provides a space saving solution to the requirement for providing ESD protection for arbitrary pin-to-pin combinations, and is especially attractive for small analog circuits in bipolar and BiCMOS technologies.
Keywords :
BiCMOS analogue integrated circuits; bipolar analogue integrated circuits; electrostatic discharge; integrated circuit reliability; integrated circuit testing; thyristors; BiCMOS; analog circuits; arbitrary pin-to-pin combinations; bidirectional SCR structures; bipolar technology; inter-linked bidirectional SCR; multiport ESD protection; numerical simulation; pad-to-pad network; silicon controlled rectifier; BiCMOS analog integrated circuits; Bipolar analog integrated circuits; Electrostatic discharges; Integrated circuit reliability; Integrated circuit testing; Thyristors;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the
Print_ISBN :
0-7803-7800-8
DOI :
10.1109/BIPOL.2003.1274953
