Title :
Research and design of dynamic integrity measurement in trusted computing
Author :
Chen, Xin ; Si, Zhigang
Author_Institution :
Inst. of Electron. Technol., Inf. Eng. Univ., Zhengzhou, China
Abstract :
In order to increase the applicability and flexibility of dynamic integrity measurement in trusted computing, a measurement model based on Xen is designed after generalizing available measurement mechanism. The platform structure of the model is simple, and the measurement mechanism of the model is implemented advisably. Comparing with the models based on other mechanism, our model is more applicable and flexible.
Keywords :
data integrity; data privacy; Xen measurement model; dynamic integrity measurement; trusted computing; Driver circuits; Hardware; Runtime; dynamic; integrity measurement; trusted computing; virtual machine;
Conference_Titel :
Educational and Information Technology (ICEIT), 2010 International Conference on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-8033-3
Electronic_ISBN :
978-1-4244-8035-7
DOI :
10.1109/ICEIT.2010.5608393
