• DocumentCode
    2656861
  • Title

    Rough Vague Sets and its Knowledge Acquisition

  • Author

    Liu, Zhao-peng ; Fang, Dan ; Feng, Lin

  • Author_Institution
    Coll. of Technol., Sichuan Normal Univ., Chengdu
  • fYear
    2009
  • fDate
    23-25 Jan. 2009
  • Firstpage
    206
  • Lastpage
    210
  • Abstract
    The rough sets approach to vague concept approximation is an emerging area of intelligence information processing that offers new theories, techniques, and tools for analysis of vague data sets. This paper makes an attempt to extend the traditional rough sets approaches to the vague data environment. First, we defined the logical implication relationship between two vague values. The implication operator is used to define vague measures between two vague sets containment. Then, by using the containment and intersection between vague sets, the notions of the lower and upper generalized rough vague approximations of a vague set are introduced. Finally, with the rough vague lower and upper approximations, we developed theories and approaches for attribute reduction and knowledge acquisition in vague objective information systems. The results of this paper show that our studies have extended the corresponding methods in classical rough sets theory, and provided a new avenue for uncertain knowledge acquisition in vague information systems.
  • Keywords
    information systems; knowledge acquisition; rough set theory; classical rough sets theory; generalized rough vague approximation; intelligence information processing; knowledge acquisition; rough vague sets; vague data environment; vague objective information system; Computer security; Educational institutions; Expert systems; Fuzzy sets; Informatics; Information security; Information systems; Information technology; Knowledge acquisition; Rough sets; Knowledge Acquisition; Rough Vague Sets;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Information Technology and Security Informatics, 2009. IITSI '09. Second International Symposium on
  • Conference_Location
    Moscow
  • Print_ISBN
    978-1-4244-3580-7
  • Type

    conf

  • DOI
    10.1109/IITSI.2009.56
  • Filename
    4777582