• DocumentCode
    2656966
  • Title

    Effect of bonding pressure on transducer ultrasonic propagation in thermosonic flip chip bonding

  • Author

    Zhili, Long ; Lei, Han ; Yunxin, Wu ; Jue, Zhong

  • Author_Institution
    Central South Univ., Changsha
  • fYear
    2006
  • fDate
    27-28 June 2006
  • Firstpage
    130
  • Lastpage
    136
  • Abstract
    As one of the key bonding parameters for thermosonic flip chip bonding, bonding pressure plays an important role for the bonding process. Moreover, as the load of the ultrasonic transducer system, bonding pressure affects directly the process of ultrasonic propagation, so it will influence the bonding quality. In this paper, in the condition that the bonding pressure was tuned regularly, the impedance characteristics of ultrasonic transducer were measured by a impedance analyzer, and the ultrasonic energy was measured by a laser Doppler vibrometer, and the shear bonding strengths at different bonding pressure settings were attained. It is shown that when the bonding pressure increases, the resonance frequency and resistance of transducer will increase, while the conductance and ultrasonic energy will turn down, and a stable and satisfied bondability can be found at a moderate pressure window. The impedance model for ultrasonic transducer was created by an equivalent circuit, and used to analyze the experimental effect of bonding pressure on ultrasonic propagation for transducer
  • Keywords
    flip-chip devices; lead bonding; shear strength; ultrasonic bonding; ultrasonic propagation; ultrasonic transducers; bonding pressure; bonding quality; impedance analyzer; impedance characteristics; impedance model; laser Doppler vibrometer; shear bonding strength; thermosonic flip chip bonding; transducer ultrasonic propagation; ultrasonic energy; ultrasonic transducer system; Bonding processes; Electrical resistance measurement; Energy measurement; Flip chip; Impedance measurement; Laser tuning; Optical propagation; Pressure measurement; Ultrasonic transducers; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0488-6
  • Type

    conf

  • DOI
    10.1109/HDP.2006.1707579
  • Filename
    1707579