DocumentCode :
2656966
Title :
Effect of bonding pressure on transducer ultrasonic propagation in thermosonic flip chip bonding
Author :
Zhili, Long ; Lei, Han ; Yunxin, Wu ; Jue, Zhong
Author_Institution :
Central South Univ., Changsha
fYear :
2006
fDate :
27-28 June 2006
Firstpage :
130
Lastpage :
136
Abstract :
As one of the key bonding parameters for thermosonic flip chip bonding, bonding pressure plays an important role for the bonding process. Moreover, as the load of the ultrasonic transducer system, bonding pressure affects directly the process of ultrasonic propagation, so it will influence the bonding quality. In this paper, in the condition that the bonding pressure was tuned regularly, the impedance characteristics of ultrasonic transducer were measured by a impedance analyzer, and the ultrasonic energy was measured by a laser Doppler vibrometer, and the shear bonding strengths at different bonding pressure settings were attained. It is shown that when the bonding pressure increases, the resonance frequency and resistance of transducer will increase, while the conductance and ultrasonic energy will turn down, and a stable and satisfied bondability can be found at a moderate pressure window. The impedance model for ultrasonic transducer was created by an equivalent circuit, and used to analyze the experimental effect of bonding pressure on ultrasonic propagation for transducer
Keywords :
flip-chip devices; lead bonding; shear strength; ultrasonic bonding; ultrasonic propagation; ultrasonic transducers; bonding pressure; bonding quality; impedance analyzer; impedance characteristics; impedance model; laser Doppler vibrometer; shear bonding strength; thermosonic flip chip bonding; transducer ultrasonic propagation; ultrasonic energy; ultrasonic transducer system; Bonding processes; Electrical resistance measurement; Energy measurement; Flip chip; Impedance measurement; Laser tuning; Optical propagation; Pressure measurement; Ultrasonic transducers; Ultrasonic variables measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0488-6
Type :
conf
DOI :
10.1109/HDP.2006.1707579
Filename :
1707579
Link To Document :
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