• DocumentCode
    2657306
  • Title

    Silver migration control in electrically conductive adhesives

  • Author

    Li, Yi ; Wong, C.P.

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2006
  • fDate
    27-28 June 2006
  • Firstpage
    206
  • Lastpage
    212
  • Abstract
    Although conductive adhesives have been studied for many years as a lead-free alternative in electronic industry, applications of electrically conductive adhesives (ECAs) for electronic interconnect are limited to low voltage display driver devices. This is due to the serious concerns associated with the long-term reliability and high voltage application issues caused by the silver migration. In this study, a novel approach to reduce silver migration and enhance the long-term reliability of conductive adhesives is discovered by using self-assembled monolayer molecular wires. The approach enhances the long-term reliability and durability of conductive adhesives and enables the ECA for high voltage applications. In addition, the self-assembled molecular wires help the dispersion of conductive fillers (in particular, nano-sized (<100 nm) conductive fillers) in the polymer matrix and enhance the electrical conductivity of conductive adhesives. Due to the high current density of those functional molecular monolayers, the current carrying capability of conductive adhesives can also be improved significantly
  • Keywords
    conductive adhesives; display devices; electrical conductivity; filler metals; monolayers; reliability; self-assembly; conductive fillers; display driver devices; electrical conductivity; electrically conductive adhesives; electronic interconnects; electronics industry; self-assembled monolayer molecular wires; silver migration; Conductive adhesives; Displays; Driver circuits; Electronics industry; Environmentally friendly manufacturing techniques; Industrial electronics; Low voltage; Self-assembly; Silver; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0488-6
  • Type

    conf

  • DOI
    10.1109/HDP.2006.1707594
  • Filename
    1707594