• DocumentCode
    2657422
  • Title

    Thermal conductivity of isotropic conductive adhesives composed of an epoxy-based binder

  • Author

    Inoue, Masahiro ; Muta, Hiroaki ; Maekawa, Takuji ; Yamanaka, Shinsuke ; Suganuma, Katsuaki

  • Author_Institution
    Inst. of Sci. & Ind. Res., Osaka Univ.
  • fYear
    2006
  • fDate
    27-28 June 2006
  • Firstpage
    236
  • Lastpage
    241
  • Abstract
    The thermal conductivity of a practical isotropic conductive adhesive (ICA) comprising of an epoxy-based binder containing flake-shaped and spherical Ag particles has been studied. The specimens exhibit anisotropy in their thermal conductivities. In addition, their thermal conductivities apparently depend on their thermal history during the curing and subsequent annealing processes, even if they are fully cured. Analysis using the Wiedemann-Franz rule indicates that their thermal conductivities increase with increasing contribution from electrical conduction. Curing and annealing conditions that induce a large shrinkage of the adhesive binder lead to decreased electrical resistivity and increased thermal conductivity, because the contacts between the filler particles are enhanced, therefore causing a decrease any interfacial resistances. In order to analyze the thermal conductivity of advanced conductive adhesives, a novel analytical method that includes a reasonable definition of the state of the percolation networks that are formed by the filler particles needs to be developed
  • Keywords
    Wiedemann-Franz law; annealing; conductive adhesives; curing; electrical resistivity; filler metals; materials testing; silver; thermal conductivity; Ag; Wiedemann-Franz rule; adhesive binder; electrical conduction; electrical resistivity; filler particles; isotropic conductive adhesives; thermal conductivity; thermal history; Anisotropic magnetoresistance; Annealing; Conductive adhesives; Contacts; Curing; Electric resistance; History; Independent component analysis; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0488-6
  • Type

    conf

  • DOI
    10.1109/HDP.2006.1707599
  • Filename
    1707599