DocumentCode
2657422
Title
Thermal conductivity of isotropic conductive adhesives composed of an epoxy-based binder
Author
Inoue, Masahiro ; Muta, Hiroaki ; Maekawa, Takuji ; Yamanaka, Shinsuke ; Suganuma, Katsuaki
Author_Institution
Inst. of Sci. & Ind. Res., Osaka Univ.
fYear
2006
fDate
27-28 June 2006
Firstpage
236
Lastpage
241
Abstract
The thermal conductivity of a practical isotropic conductive adhesive (ICA) comprising of an epoxy-based binder containing flake-shaped and spherical Ag particles has been studied. The specimens exhibit anisotropy in their thermal conductivities. In addition, their thermal conductivities apparently depend on their thermal history during the curing and subsequent annealing processes, even if they are fully cured. Analysis using the Wiedemann-Franz rule indicates that their thermal conductivities increase with increasing contribution from electrical conduction. Curing and annealing conditions that induce a large shrinkage of the adhesive binder lead to decreased electrical resistivity and increased thermal conductivity, because the contacts between the filler particles are enhanced, therefore causing a decrease any interfacial resistances. In order to analyze the thermal conductivity of advanced conductive adhesives, a novel analytical method that includes a reasonable definition of the state of the percolation networks that are formed by the filler particles needs to be developed
Keywords
Wiedemann-Franz law; annealing; conductive adhesives; curing; electrical resistivity; filler metals; materials testing; silver; thermal conductivity; Ag; Wiedemann-Franz rule; adhesive binder; electrical conduction; electrical resistivity; filler particles; isotropic conductive adhesives; thermal conductivity; thermal history; Anisotropic magnetoresistance; Annealing; Conductive adhesives; Contacts; Curing; Electric resistance; History; Independent component analysis; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
Conference_Location
Shanghai
Print_ISBN
1-4244-0488-6
Type
conf
DOI
10.1109/HDP.2006.1707599
Filename
1707599
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