DocumentCode :
2657422
Title :
Thermal conductivity of isotropic conductive adhesives composed of an epoxy-based binder
Author :
Inoue, Masahiro ; Muta, Hiroaki ; Maekawa, Takuji ; Yamanaka, Shinsuke ; Suganuma, Katsuaki
Author_Institution :
Inst. of Sci. & Ind. Res., Osaka Univ.
fYear :
2006
fDate :
27-28 June 2006
Firstpage :
236
Lastpage :
241
Abstract :
The thermal conductivity of a practical isotropic conductive adhesive (ICA) comprising of an epoxy-based binder containing flake-shaped and spherical Ag particles has been studied. The specimens exhibit anisotropy in their thermal conductivities. In addition, their thermal conductivities apparently depend on their thermal history during the curing and subsequent annealing processes, even if they are fully cured. Analysis using the Wiedemann-Franz rule indicates that their thermal conductivities increase with increasing contribution from electrical conduction. Curing and annealing conditions that induce a large shrinkage of the adhesive binder lead to decreased electrical resistivity and increased thermal conductivity, because the contacts between the filler particles are enhanced, therefore causing a decrease any interfacial resistances. In order to analyze the thermal conductivity of advanced conductive adhesives, a novel analytical method that includes a reasonable definition of the state of the percolation networks that are formed by the filler particles needs to be developed
Keywords :
Wiedemann-Franz law; annealing; conductive adhesives; curing; electrical resistivity; filler metals; materials testing; silver; thermal conductivity; Ag; Wiedemann-Franz rule; adhesive binder; electrical conduction; electrical resistivity; filler particles; isotropic conductive adhesives; thermal conductivity; thermal history; Anisotropic magnetoresistance; Annealing; Conductive adhesives; Contacts; Curing; Electric resistance; History; Independent component analysis; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0488-6
Type :
conf
DOI :
10.1109/HDP.2006.1707599
Filename :
1707599
Link To Document :
بازگشت