Title :
Design automation of test for the ES/9000 series processors
Author :
Keller, Brion L. ; Haynes, David A.
Author_Institution :
IBM Corp., Endicott, NY, USA
Abstract :
IBM tests each component, subassembly and system it manufactures in order to ensure that only a fully functioning, quality product is shipped to the customer. Most of the tests that are applied to these circuits are derived automatically by design automation software. This software has been developed and maintained over the last 20+ years by IBM´s Test Design Automation group in Endicott, New York. The recently announced ES/9000 processors all used this design automation support. In fact, some recently developed software for support of self testing circuits was developed specifically for these processors. An overview is given of this design automation support and the methodologies used to test the newly announced ES/9000 processors
Keywords :
IBM computers; computer testing; mainframes; ES/9000 series processors; design automation of test; design automation software; self testing circuits; Automatic testing; Circuit faults; Circuit testing; Design automation; Design engineering; Logic testing; Manufacturing automation; Software testing; System testing; Test pattern generators;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-2270-9
DOI :
10.1109/ICCD.1991.139970
