Title :
Analysis of harmonic distortion in deep submicron CMOS
Author :
Bucher, Matthias ; Bazigos, Antonios ; Nastos, Nikolaos ; Papananos, Yannis ; Krummenacher, François ; Yoshitomi, Sadayuki
Author_Institution :
Tech. Univ. Crete, Chania, Greece
Abstract :
This paper presents a study of harmonic distortion measurement and modeling in an 0.14 um CMOS technology. Measurements and simulation of DC characteristics, as well as high-frequency harmonic distortion are presented. The new EKV3.0 compact MOSFET model is used to model DC and harmonic distortion characteristics.
Keywords :
CMOS integrated circuits; MOSFET; circuit simulation; harmonic distortion; integrated circuit measurement; integrated circuit modelling; radiofrequency integrated circuits; 0.14 micron; CMOS technology; DC characteristics; EKV3.0 compact MOSFET model; harmonic distortion measurement; harmonic distortion modeling; high-frequency harmonic distortion; simulation; CMOS technology; Current measurement; Distortion measurement; Frequency measurement; Harmonic analysis; Harmonic distortion; MOS devices; MOSFET circuits; Radio frequency; Semiconductor device modeling;
Conference_Titel :
Electronics, Circuits and Systems, 2004. ICECS 2004. Proceedings of the 2004 11th IEEE International Conference on
Print_ISBN :
0-7803-8715-5
DOI :
10.1109/ICECS.2004.1399701
