• DocumentCode
    2657557
  • Title

    Low cycle fatigue of Sn-based lead-free solder joints and the analysis of fatigue life prediction uncertainty

  • Author

    Andersson, Cristina ; Sun, Peng ; Liu, Johan

  • Author_Institution
    Dept. of Microtechnology & Nanoscience, Chalmers Univ. of Technol., Gothenburg
  • fYear
    2006
  • fDate
    27-28 June 2006
  • Firstpage
    272
  • Lastpage
    279
  • Abstract
    Solder joints of Sn-37Pb, Sn-3.5Ag, Sn-4.0Ag-0.5Cu and Sn-8Zn-3Bi (all compositions in wt%) were tested by means of isothermal low cycle mechanical fatigue at room temperature over a wide range of strain ranges (1%-10%). The eutectic Sn-37wt%Pb was used as a reference. Single lap shear samples with solder joints 0.45mm in height and 1.6mm in diameter were used. The testing was executed in a displacement-controlled mode, at three different amplitudes namely, 30, 40 and 50mum. The frequency used was 0.2Hz. The displacement waveform was triangular, due to its constant strain rate. The Coffin-Manson law was compared to the Morrow´s energy model and both the energy density value and the plastic strain range values were calculated in different ways to analyse the uncertainty in the calculation methodology of fatigue life. According to the results, the solder alloy with the best isothermal fatigue properties is the ternary Sn-4.0Ag-0.5Ag. The Sn-3.5Ag-3Bi exhibited quite poor fatigue properties, worse than all the other alloys tested. Regarding the model used for fatigue life prediction, both methods gave consistent results
  • Keywords
    bismuth alloys; copper alloys; fatigue; fatigue testing; lead alloys; silver alloys; tin alloys; zinc alloys; 0.2 Hz; 0.45 mm; 1.6 mm; Coffin-Manson law; Morrows energy model; Sn-Ag; Sn-Ag-Ag; Sn-Ag-Cu; Sn-Pb; Sn-Zn-Bi; displacement-controlled mode; energy density value; fatigue life prediction uncertainty; isothermal low cycle mechanical fatigue; lead-free solder joints; plastic strain range value; Capacitive sensors; Environmentally friendly manufacturing techniques; Fatigue; Frequency; Isothermal processes; Lead; Soldering; Temperature distribution; Testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    1-4244-0488-6
  • Type

    conf

  • DOI
    10.1109/HDP.2006.1707606
  • Filename
    1707606