DocumentCode :
2657748
Title :
The influence of oscillator behavior on accumulated phase error during dynamic environmental conditions
Author :
Wacker, Mike F. ; Matthews, Peter
Author_Institution :
Vectron Int., Mount Holly Springs, PA, USA
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
1
Lastpage :
6
Abstract :
This paper examines the phase error that can occur in telecommunication systems during exposure of oven controlled crystal oscillators (OCXO) to various airflow scenarios in open-loop or closed-loop operation. The objective is to make system designers aware of largely undocumented and unadvertised OCXO behavioral characteristics. With this knowledge, the designer is better able to anticipate and successfully solve problematic timing issues.
Keywords :
crystal oscillators; OCXO; accumulated phase error; airflow scenarios; closed-loop operation; dynamic environmental conditions; open-loop operation; oven controlled crystal oscillators; problematic timing issues; telecommunication systems; Bandwidth; Frequency modulation; Noise; Oscillators; Temperature; Time frequency analysis; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2012 IEEE International
Conference_Location :
Baltimore, MD
ISSN :
1075-6787
Print_ISBN :
978-1-4577-1821-2
Type :
conf
DOI :
10.1109/FCS.2012.6243616
Filename :
6243616
Link To Document :
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