Title :
Analysis of mechanical strength for flip-chip bonding of GaAs MMIC
Author :
Zhang, Bo ; Murugesan, Vignesh ; Billström, Niklas ; Stenquist, Patrik ; Liu, Johan
Author_Institution :
Dept. of Microtechnol. & Nanosci., Chalmers Univ. of Technol., Goteborg
Abstract :
Increased packaging demands in wireless communications, and military electronics has led to the use of flip-chips for RF and microwave applications. For a reliable bonding of flip-chip interconnection, proper knowledge of bonding parameters and bonding ability to different substrates is important. This paper depicts a comparative analysis of flip-chip bonding of GaAs MMIC (monolithic microwave integrated circuit) to thick/thin film metallization on ceramic substrates (hereinafter thick-film and thin-film), and organic substrates using anisotropic conductive film (ACF), thermo-compression (TC) bonding methods with different bonding parameters. The results from the optimization study of the parameter settings for mechanical reliability of ACF and TC with different substrates are presented
Keywords :
III-V semiconductors; MMIC; bonding processes; flip-chip devices; gallium arsenide; mechanical strength; GaAs; MMIC; anisotropic conductive film; ceramic substrates; flip chip bonding; mechanical strength; organic substrates; thermo compression bonding; thick/thin film metallization; Anisotropic conductive films; Bonding; Electronics packaging; Gallium arsenide; Integrated circuit reliability; MMICs; Military communication; Substrates; Thin film circuits; Wireless communication;
Conference_Titel :
High Density Microsystem Design and Packaging and Component Failure Analysis, 2006. HDP'06. Conference on
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0488-6
DOI :
10.1109/HDP.2006.1707615