• DocumentCode
    2658117
  • Title

    Influence of automatic level control on micromechanical resonator oscillator phase noise

  • Author

    Lee, Seungbae ; Nguyen, Clark T -C

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    2003
  • fDate
    4-8 May 2003
  • Firstpage
    341
  • Lastpage
    349
  • Abstract
    Clear differences in the phase noise performance of a 10 MHz MEMS-based micromechanical resonator oscillator have been measured using sustaining circuits with and without automatic-level control (ALC), and with differing mechanisms for ALC. In particular, low output power oscillators referenced to high-Q clamped-clamped beam μmechanical resonators exhibit an unexpected 1/f3 phase noise component without ALC, a 1/f5 phase noise component when an ALC circuit based on resonator dc-bias adjustment is used, and finally, removal of these components when an ALC circuit based on sustaining amplifier gain control is used, in which case the expected 1/f2 phase noise component is all that remains. That ALC is able to remove the 1/f3 phase noise seen in non-ALC´ed oscillators suggests that this noise component emanates primarily from nonlinearity in the voltage-to-force capacitive transducer, either through direct aliasing of amplifier 1/f noise, or through instabilities introduced by spring softening (i.e., Duffing) phenomena.
  • Keywords
    1/f noise; gain control; micromechanical resonators; microwave oscillators; operational amplifiers; oscillators; phase noise; 1/f3 phase noise; 10 MHz; MEMS based micromechanical resonator oscillator phase noise; amplifier gain control; automatic level control; low output power oscillators; spring softening; voltage-force capacitive transducer; Automatic control; Automatic logic units; Circuits; Level control; Micromechanical devices; Noise measurement; Oscillators; Phase measurement; Phase noise; Power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-7688-9
  • Type

    conf

  • DOI
    10.1109/FREQ.2003.1275113
  • Filename
    1275113