Title :
A New Pitch-angle Diagnostic For Magnetized plasmas
Author :
Lam, S.W. ; Hershkowitz, Noah
Author_Institution :
University of Wisconsin
Keywords :
Bandwidth; Dielectrics; Etching; Filling; Magnetic flux; Plasma applications; Plasma diagnostics; Plasma measurements; Plasma sheaths; Plasma temperature;
Conference_Titel :
Plasma Science,1992. IEEE Conference Record - Abstracts., 1992 IEEE International Conference on
Conference_Location :
Tampa, FL, USA
Print_ISBN :
0-7803-0716-X
DOI :
10.1109/PLASMA.1992.697899
