DocumentCode :
2658450
Title :
Short-term stability of miniature double oven crystal oscillators using conventional and DHR technology
Author :
Abramzon, I. ; Boroditsky, R. ; Tapkov, V.
Author_Institution :
VFT Technol., USA
fYear :
2003
fDate :
4-8 May 2003
Firstpage :
458
Lastpage :
463
Abstract :
The present work is devoted to experimental research on the influence of thermal fluctuations in the oven-controlled system on phase noise and short-term stability (STS) of the high stability double-oven crystal oscillators (DOCXO). The paper describes the method of the study and discusses obtained results. The research showed that measured level of STS of the DOCXO (3.0-3.5)·10-12 - is not limited by the thermal noise of the ovens. However, improvement of the STS below (1-2)·10-12 will require minimization of the temperature fluctuations in the double-oven system.
Keywords :
crystal oscillators; phase noise; thermal noise; thermal stability; miniature double oven crystal oscillators; oven controlled system; phase noise; short term stability; temperature fluctuations; thermal fluctuations; thermal noise; Aging; Circuits; DH-HEMTs; Fluctuations; Oscillators; Ovens; Packaging; Sociotechnical systems; Stability; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-7688-9
Type :
conf
DOI :
10.1109/FREQ.2003.1275135
Filename :
1275135
Link To Document :
بازگشت