• DocumentCode
    2658487
  • Title

    High frequency OCXO for Space applications

  • Author

    Reddy, M. Brahmananda ; Swarna, S. ; Priskala ; Chandrashekar, M. ; Vinod, C. ; Dhruva, P.M. ; Singh, D.K.

  • Author_Institution
    Centum Rakon India Pvt Ltd., Bangalore, India
  • fYear
    2012
  • fDate
    21-24 May 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    In recent times there is an increasing demand for the use of high frequency Oven Controlled Crystal Oscillators (OCXO) as a reference source for satellite communication payloads. OCXOs with reference frequency of 128MHz are designed & realized. OCXOs are proposed to be used in satellite communication payloads by Indian Space Research Organization (ISRO). The goal was to demonstrate the electrical performance & ruggedness of OCXO for Space application. The Main performance parameters achieved for Flight Model (FM) OCXO is summarized. Parameters of the Crystal used for this application to achieve optimum performance is also discussed. The Screening test of FM units have undergone through Stabilization Bake, Initial Stage Aging at 60°C, Thermal Shock, Operational Temp Test, Random vibration, Aging at 25°C, Radiographic inspection as per MIL standards. Thermo vacuum test is also carried out on few samples.
  • Keywords
    ageing; crystal oscillators; inspection; satellite communication; space communication links; space vehicle electronics; thermal shock; vibrations; FM OCXO; ISRO; Indian Space Research Organization; MIL standard; flight model; frequency 128 MHz; high-frequency OCXO; high-frequency oven controlled crystal oscillator; operational temp test; radiographic inspection; random vibration; satellite communication payload; screening test; space application; stabilization bake; temperature 25 degC; temperature 60 degC; thermal shock; thermo vacuum test; Aging; Circuit stability; Crystals; Ovens; Phase noise; Thermal stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium (FCS), 2012 IEEE International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-4577-1821-2
  • Type

    conf

  • DOI
    10.1109/FCS.2012.6243649
  • Filename
    6243649