• DocumentCode
    2658520
  • Title

    Analysis of the mechanism and characteristic for energy loss in a gate-commutated thyristor

  • Author

    Zhang, Ru-Liang ; Gao, Yong ; Chen, Xi ; Wang, Cai-Lin

  • Author_Institution
    Xi ´´an Univ. of Technol., Xi´´an
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Gate commutated thyristor (GCT) is a novel power semiconductor device derived from gate turn-off thyristor (GTO). It integrates with gate driver circuit to construct integrated gate commutated thyristor (IGCT). The application technology of IGCT is growing up, however, its energy loss can only be evaluated by external circuit or be measured by instruments, and no literatures depicts theory analysis for composition of energy loss and estimation expressions of the GCT. Power loss mechanism due to structure features and the turn-on and turn-off Gate commutated thyristor (GCT) is a novel power semiconductor device derived from gate turn-off thyristor (GTO). It integrates with gate driver circuit to construct integrated gate commutated thyristor (IGCT). The application technology of IGCT is growing up, however, its energy loss can only be evaluated by external circuit or be measured by instruments, and no literatures depicts theory analysis for composition of energy loss and estimation expressions of the GCT. Power loss mechanism, due to structure features and the operation mechanism in the turn-on and turn-off state, of GCT was discussed in this paper.
  • Keywords
    losses; thyristors; energy loss; gate-commutated thyristor; operation mechanism; power loss mechanism; power semiconductor device; structure feature; turn-off state; turn-on state; Anodes; Circuit simulation; Educational institutions; Energy loss; Equations; Integrated circuit technology; Spontaneous emission; Thyristors; Turning; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1892-3
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422353
  • Filename
    4422353