DocumentCode :
2658682
Title :
In situ measurement of ceramic vacuum chamber conductive coating quality
Author :
Doose, C. ; Harkay, K. ; Kim, S. ; Milton, S.
Author_Institution :
Adv. Photon Souce, Argonne Nat. Lab., IL, USA
Volume :
3
fYear :
1997
fDate :
12-16 May 1997
Firstpage :
3577
Abstract :
A method for measuring the relative surface resistivity and quality of conductive coatings on ceramic vacuum chambers was developed. This method is unique in that it allows one to test the coating even after the ceramic chamber is installed in the accelerator and under vacuum; furthermore, the measurement provides a localized surface reading of the coating conductance. The method uses a magnetic probe of wire wound on a ferrite and an LCR meter. The probe is calibrated using the measured DC end-to-end resistance of the tube under test and by comparison to a high quality test surface. The measurement method has also been verified by comparison to high frequency impedance measurements. A detailed description, results, and sensitivity of the technique are given here
Keywords :
ceramics; electron accelerators; protective coatings; storage rings; surface conductivity; vacuum apparatus; APS; Advanced Photon Source; accelerator; ceramic vacuum chamber conductive coating quality; high frequency impedance; in situ measurement; localized surface reading; magnetic probe; relative surface resistivity; Ceramics; Coatings; Conductivity measurement; Electrical resistance measurement; Impedance measurement; Life estimation; Probes; Surface resistance; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-4376-X
Type :
conf
DOI :
10.1109/PAC.1997.753279
Filename :
753279
Link To Document :
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