Automatic system for VLSI on-chip clock synthesizers characterization

Analyzing the ability of clock generation circuits to provide a high quality chip clock for synchronous systems is very critical. This is important in order to ensure stable functioning of such systems at the highest frequencies, in addition to ensuring reliable communications between core, on-chip peripherals, external peripherals and memory. We propose a clock synthesizer characterization system, which performs measurements automatically, according to the clock synthesizer´s mode, frequency, power supply voltage and ambient temperature. The system is intended to work in both quiet and noisy environments. The accuracy of the measurements, together with the system´s high flexibility and speed, allows on-the-spot characterizations, which in turn results in a detailed, statistically reliable picture of the clock signal´s quality. Practical experience has shown that this system is effective, not only for clock synthesizer characterization, but for failure analysis as well.