DocumentCode
2658805
Title
Determination of Complex Dielectric and Magnetic Properties of Materials
Author
Weisbrod, S. ; Morgan, L.A. ; Hughes, L.R.
fYear
1977
fDate
21-23 June 1977
Firstpage
121
Lastpage
123
Abstract
The paper describes a modified Von Hippel technique for determination of complex dielectric and magnetic properties of materials. The technique uses least square fit to derive the scatter matrix parameters for calibrating out internal reflection between the sample and the reflection measuring equipment. Least square fit is also used to determine best values of mu and epsilon.
Keywords
Dielectric materials; Equations; Joining processes; Least squares methods; Magnetic materials; Magnetic properties; Reflection; Scattering parameters; Transmission line matrix methods; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1977 IEEE MTT-S International
Conference_Location
San Diego, CA, USA
Type
conf
DOI
10.1109/MWSYM.1977.1124380
Filename
1124380
Link To Document