• DocumentCode
    2658856
  • Title

    Gate dielectric engineering of sub quarter micron AlGaN/GaN metal insulator semiconductor heterostructure field effect transistor (MISHFET) for high gain characteristics

  • Author

    Aggarwal, Ruchika ; Agrawal, Anju ; Gupta, Mridula ; Gupta, R.S.

  • Author_Institution
    Univ. of Delhi, New Delhi
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The gate dielectric engineering of MISHFET structure offers superior performance over conventional HFETs in terms of high power handling capacity as well as high gain characteristics. The closed form analytical model for different gate dielectric schemes has been formulated by taking into account the effect of nonlinear polarization, which plays very important effect in AlGaN/GaN material system. The electrical characteristics like drain current and transconductance are evaluated for different gate dielectric schemes and compared with uniform dielectric configuration.
  • Keywords
    III-V semiconductors; MISFET; aluminium compounds; dielectric polarisation; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; AlGaN-GaN; analytical model; drain current; gate dielectric engineering; metal insulator semiconductor heterostructure field effect transistor; nonlinear polarization effect; sub quarter micron MISHFET structure; transconductance; Aluminum gallium nitride; Analytical models; Dielectrics and electrical insulation; Gallium nitride; HEMTs; MODFETs; Metal-insulator structures; Performance gain; Polarization; Power engineering and energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1892-3
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422371
  • Filename
    4422371