DocumentCode :
2658888
Title :
Nonlinear behavior of an UHF quartz resonator in an oscillating system
Author :
Moyer, H.P. ; Nagele, R.G. ; Kubena, R.L. ; Joyce, R.J. ; Kirby, D.J. ; Yong, Y. -K ; Brewer, P.D. ; Chang, D.T.
Author_Institution :
HRL Labs., LLC, Malibu, CA, USA
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
1
Lastpage :
5
Abstract :
Characterization of a quartz resonator operating at 553 MHz in a closed loop oscillating system has been performed under various drive levels to characterize its nonlinear behavior. The voltage and current were measured across the resonator using differential active probes and used to calculate the magnitude of the admittance under drive. Our results show that nonlinear resonator operation widens the bandwidth of low phase noise operation. At the low frequency end of the operating range, where overall phase noise is degraded, phase noise improvement is ~ 20dB. However, the overall phase noise levels do not improve significantly over the linear case.
Keywords :
UHF resonators; crystal resonators; phase noise; UHF quartz resonator; closed loop oscillating system; differential active probes; frequency 533 MHz; low phase noise operation; nonlinear resonator operation; phase noise levels; Admittance; Admittance measurement; Optical resonators; Phase noise; Resonant frequency; Voltage measurement; DLD; Duffing; MEMS; Quartz; drive level dependency; nonlinear dynamics; oscillators; phase noise; resonator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2012 IEEE International
Conference_Location :
Baltimore, MD
ISSN :
1075-6787
Print_ISBN :
978-1-4577-1821-2
Type :
conf
DOI :
10.1109/FCS.2012.6243670
Filename :
6243670
Link To Document :
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