DocumentCode :
2659099
Title :
Design and synthesis of self-checking VLSI circuits and systems
Author :
Jha, Niraj K. ; Wang, Sying-Jyan
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
fYear :
1991
fDate :
14-16 Oct 1991
Firstpage :
578
Lastpage :
581
Abstract :
Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, and thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. Methods are explored for the cost-effective design of combinational and sequential functional circuits, checkers and systems
Keywords :
VLSI; built-in self test; error detection; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; combinatorial circuits; permanent faults; self-checking VLSI circuits; self-checking functional circuits; sequential functional circuits; Circuit faults; Circuit synthesis; Circuits and systems; Contamination; Design methodology; Electrical fault detection; Fault detection; Logic; Redundancy; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 1991. ICCD '91. Proceedings, 1991 IEEE International Conference on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-2270-9
Type :
conf
DOI :
10.1109/ICCD.1991.139977
Filename :
139977
Link To Document :
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