• DocumentCode
    2659222
  • Title

    Influence of the rise time and of the temperature on the PD inception voltage of enameled wires

  • Author

    Guastavino, F. ; Cotella, G. ; Dardano, A. ; Massa, G.F. ; Ratto, A. ; Squarcia, S. ; Torello, E.

  • Author_Institution
    Electr. Eng. Dept., Univ. of Genova, Genoa, Italy
  • fYear
    2010
  • fDate
    17-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This work describes an investigation about the influence of two service parameter on the PD inception voltage threshold of type I random wire wound stator insulation; the temperature and the voltage gradient (i.e. the rise time). An experimental campaign of PD inception tests was carried out on twisted pair specimens applying unipolar voltage pulses having different rise time. The results have been compared to PDIV measurement obtained applying to twisted pairs other voltage waveforms: sinusoidal voltage and voltage waveforms reproducing the output of a PWM switching drive with or without superimposed surges. The outcome evidences some interesting trend of the inception voltage with the voltage gradient and the test temperature that could be usefully used in order to relate test conditions to actual operating conditions of random wire wound motors.
  • Keywords
    discharges (electric); electric potential; enamels; insulated wires; pulse width modulation; stators; twisted pair cables; PD inception test; PD inception voltage; PDIV measurement; PWM switching drive; enameled wire; random wire wound motor; random wire wound stator insulation; rise time; sinusoidal voltage; temperature; twisted pair specimen; unipolar voltage pulse; voltage gradient; voltage waveform; Insulation; Partial discharges; Pulse width modulation; Stator windings; Surges; Voltage measurement; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
  • Conference_Location
    West Lafayette, IN
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-9468-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2010.5724000
  • Filename
    5724000