DocumentCode
2659373
Title
Assymetry Of Off-Track Capability of MR Heads At Different Skew Angles
Author
Sheng-Bin Hu ; Bo Liu ; Teck-Seng Low
Author_Institution
National University of Singapore
fYear
1997
fDate
1-4 April 1997
Keywords
Contamination; Degradation; Electrooptic effects; Magnetic field measurement; Magnetic heads; Magnetic recording; Memory; Pollution measurement; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-3862-6
Type
conf
DOI
10.1109/INTMAG.1997.597745
Filename
597745
Link To Document