DocumentCode :
2659373
Title :
Assymetry Of Off-Track Capability of MR Heads At Different Skew Angles
Author :
Sheng-Bin Hu ; Bo Liu ; Teck-Seng Low
Author_Institution :
National University of Singapore
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Contamination; Degradation; Electrooptic effects; Magnetic field measurement; Magnetic heads; Magnetic recording; Memory; Pollution measurement; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597745
Filename :
597745
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2659373
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