DocumentCode :
2659384
Title :
Non-scanning measurements for determining in-plane mode shapes in piezoelectric devices with polished surfaces
Author :
Watanabe, Yasuaki ; Goka, Shigeyoshi ; Sato, Takayuki ; Sekimoto, Hitoshi
Author_Institution :
Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
fYear :
2003
fDate :
4-8 May 2003
Firstpage :
753
Lastpage :
756
Abstract :
Based on laser speckle interference, we developed a non-mechanical scanning method of visualizing the mode shapes of piezoelectric devices with polished surfaces. The best way to obtain positive proof of reliability is by comparing vibrational distribution predicted by analysis and distribution obtained experimentally. This is why a various of methods have been developed and reported for plotting the vibrational distribution of piezoelectric devices. At the 2002 international frequency control symposium, we proposed a method of in-plane mode shape visualization, for bulk and surface acoustic wave devices that combined laser speckle interferometry and two-dimensional correlation filtering. We demonstrated that very clear vibrational patterns of in-plane and out-of-plane shapes in high-frequency AT-cut quartz resonators with roughly finished surfaces could quickly be obtained by using this technique. This paper discusses improvements to our laser speckle-correlation method to measure the in-plane vibrational distributions in piezoelectric devices with polished surfaces. We applied this method to measure the fundamental thickness modes in mesa-shaped AT-cut quartz resonators with polished surfaces, and verified that the mesa structure provides a superior energy-trapping effect that anticipated from computation.
Keywords :
bulk acoustic wave devices; crystal resonators; light interferometry; optical variables measurement; quartz; surface acoustic wave devices; thickness measurement; 2D correlation filtering; SiO2; bulk acoustic wave device; energy trapping effect; high-frequency AT-cut quartz resonators; in-plane mode shape visualization; laser speckle interferometry; mesa structure; nonmechanical scanning measurements; piezoelectric devices; polished surfaces; quartz resonator; surface acoustic wave device; two-dimensional correlation filtering; vibrational distribution; Laser modes; Piezoelectric devices; Rough surfaces; Shape measurement; Speckle; Surface acoustic wave devices; Surface emitting lasers; Surface roughness; Vibration measurement; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
ISSN :
1075-6787
Print_ISBN :
0-7803-7688-9
Type :
conf
DOI :
10.1109/FREQ.2003.1275187
Filename :
1275187
Link To Document :
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