Low jitter and temperature stable MEMS oscillators

Author

Lee, Haechang ; Partridge, Aaron ; Assaderaghi, Fari

Author_Institution

SiTime Inc., Sunnyvale, CA, USA

fYear

2012

fDate

21-24 May 2012

Firstpage

1

Lastpage

5

Abstract

This paper will provide an update of SiTime´s TCXO technology and benchmark 4G & GPS specifications to show that SiTime´s MEMS oscillators are capable of meeting these challenging specifications. This MEMS-based TCXO is able to achieve the following which was considered possible only with quartz oscillators: phase noise of -145dBc/Hz @ 10kHz offset and 19.2MHz carrier, frequency stability of 0.2 ppm over industrial temperature range (-40 to 85°C), Allan deviation of 3e-10 using 1 sec averaging time, and random phase jitter of 0.5ps RMS integrated from 12kHz to 20MHz.

Keywords

crystal oscillators; frequency stability; jitter; micromechanical devices; phase noise; 4G specifications; GPS specifications; MEMS-based TCXO; SiTime MEMS oscillators; SiTime TCXO technology; frequency 12 kHz to 20 MHz; frequency 19.2 MHz; frequency stability; phase noise; quartz oscillators; random phase jitter; temperature -40 degC to 85 degC; temperature stable MEMS oscillators; time 0.5 ps; time 1 s; Global Positioning System; Jitter; Micromechanical devices; Phase noise; Thermal stability;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium (FCS), 2012 IEEE International

Conference_Location

Baltimore, MD

ISSN

1075-6787

Print_ISBN

978-1-4577-1821-2

Type

conf

DOI

10.1109/FCS.2012.6243704

Filename

6243704