DocumentCode :
2659586
Title :
Low jitter and temperature stable MEMS oscillators
Author :
Lee, Haechang ; Partridge, Aaron ; Assaderaghi, Fari
Author_Institution :
SiTime Inc., Sunnyvale, CA, USA
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
1
Lastpage :
5
Abstract :
This paper will provide an update of SiTime´s TCXO technology and benchmark 4G & GPS specifications to show that SiTime´s MEMS oscillators are capable of meeting these challenging specifications. This MEMS-based TCXO is able to achieve the following which was considered possible only with quartz oscillators: phase noise of -145dBc/Hz @ 10kHz offset and 19.2MHz carrier, frequency stability of 0.2 ppm over industrial temperature range (-40 to 85°C), Allan deviation of 3e-10 using 1 sec averaging time, and random phase jitter of 0.5ps RMS integrated from 12kHz to 20MHz.
Keywords :
crystal oscillators; frequency stability; jitter; micromechanical devices; phase noise; 4G specifications; GPS specifications; MEMS-based TCXO; SiTime MEMS oscillators; SiTime TCXO technology; frequency 12 kHz to 20 MHz; frequency 19.2 MHz; frequency stability; phase noise; quartz oscillators; random phase jitter; temperature -40 degC to 85 degC; temperature stable MEMS oscillators; time 0.5 ps; time 1 s; Global Positioning System; Jitter; Micromechanical devices; Phase noise; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2012 IEEE International
Conference_Location :
Baltimore, MD
ISSN :
1075-6787
Print_ISBN :
978-1-4577-1821-2
Type :
conf
DOI :
10.1109/FCS.2012.6243704
Filename :
6243704
Link To Document :
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