DocumentCode
2659712
Title
Analysis of the Major Loss Processes in Mid-Infrared Type-II fiWfl Diode Lasers
Author
O´Brien, K. ; Adams, A.R. ; Sweeney, S.J. ; Jin, S.R. ; Ahmad, C.N. ; Murdin, B.N. ; Canedy, C.L. ; Vurgaftman, I. ; Meyer, J.R.
Author_Institution
Adv. Technol. Inst., Surrey Univ., Guildford
fYear
2006
fDate
2006
Firstpage
43
Lastpage
44
Abstract
The results from high-pressure and low-temperature measurements on mid-infrared type-II W-structure lasers suggest that Auger recombination is the major loss process that prevents their continuous-wave operation at room temperature
Keywords
Auger effect; laser beams; optical losses; semiconductor lasers; thermo-optical effects; Auger recombination; continuous-wave operation; high-pressure measurement; loss analysis; low-temperature measurement; mid-infrared type-II "W" diode lasers; Diode lasers; Gas lasers; Photonic band gap; Quantum well lasers; Radiative recombination; Semiconductor lasers; Spontaneous emission; Temperature dependence; Temperature distribution; Threshold current;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Laser Conference, 2006. Conference Digest. 2006 IEEE 20th International
Conference_Location
Kohala Coast, HI
Print_ISBN
0-7803-9560-3
Type
conf
DOI
10.1109/ISLC.2006.1708077
Filename
1708077
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