• DocumentCode
    2659751
  • Title

    Electronic properties of TiO2 thin films under UV light irradiation

  • Author

    Watanabe, Y. ; Muramoto, Y. ; Shimizu, N.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Meijo Univ., Nagoya, Japan
  • fYear
    2010
  • fDate
    17-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    TiO2 has photocatalysis. When UV light irradiated, electron-hole pairs are generated in TiO2. The source of photocatalysis is oxidation and reduction reactions due to electrons and holes at the surface. In this paper, we tried to obtain the electronic properties such as resistivity, carrier density and mobility in anatase TiO2 thin films under UV light irradiation. The resistivity decreased with UV light intensity. Without UV light irradiation, the resistivity was over the measuring range. The measured values of the Hall voltage were not stable. We consider contributions to the Hall voltage of electrons and holes are canceled each other as an intrinsic semiconductor. It is also suggested that mobilities of electrons and holes have unstable behavior under the combination of magnetic field and UV light irradiation.
  • Keywords
    carrier density; carrier mobility; catalysis; electrical resistivity; electron-hole recombination; photochemistry; semiconductor materials; semiconductor thin films; titanium compounds; ultraviolet radiation effects; Hall voltage; TiO2; UV light irradiation; anatase thin films; carrier density; carrier mobility; electrical resistivity; electron-hole pairs; electronic properties; Charge carrier processes; Conductivity; Magnetic field measurement; Magnetic fields; Radiation effects; Semiconductor device measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
  • Conference_Location
    West Lafayette, IN
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-9468-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2010.5724029
  • Filename
    5724029