DocumentCode :
2659761
Title :
Temperature compensated resonance modes of degenerately n-doped silicon MEMS resonators
Author :
Jaakkola, Antti ; Prunnila, Mika ; Pensala, Tuomas
Author_Institution :
VTT Tech. Res. Centre of Finland, Espoo, Finland
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
1
Lastpage :
5
Abstract :
We model the temperature coefficients of resonance modes of degenerately n-type doped silicon resonators. By combining results from FEM-based sensitivity analysis and modelling of elastic constants of silicon with free carrier theory we are able to identify classes of resonance modes that can be temperature compensated via n-type doping. These include bulk modes such as the width/length extensional modes of a beam, Lamé/square extensional modes of a plate resonator, as well as flexural and torsional resonance modes. Our results show that virtually all resonance modes of practical importance can reach zero TCF when the resonator is aligned to a correct crystallographic orientation and when the n-dopant concentration is suitably selected.
Keywords :
compensation; elastic constants; elemental semiconductors; finite element analysis; micromechanical resonators; sensitivity analysis; silicon; FEM-based sensitivity analysis; Lame-square extensional mode; Si; beam width-length extensional mode; bulk modes; crystallographic orientation; degenerately n-doped silicon MEMS resonators; elastic constants; flexural resonance mode; free carrier theory; n-dopant concentration; plate resonator; temperature coefficient; temperature-compensated resonance modes; torsional resonance mode; Doping; Geometry; IP networks; Micromechanical devices; Resonant frequency; Shape; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2012 IEEE International
Conference_Location :
Baltimore, MD
ISSN :
1075-6787
Print_ISBN :
978-1-4577-1821-2
Type :
conf
DOI :
10.1109/FCS.2012.6243712
Filename :
6243712
Link To Document :
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