DocumentCode :
2659773
Title :
Bulk acoustic wave propagation characteristics in degenerately n-doped Si
Author :
Pensala, Tuomas ; Prunnila, Mika ; Jaakkola, Antti
Author_Institution :
VTT Tech. Res. Centre of Finland, Espoo, Finland
fYear :
2012
fDate :
21-24 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
The effect of degenerate level n-type doping on the bulk acoustic wave propagation properties in single crystal silicon is studied. Keyes´ theory [1] is used to calculate the electronic effect of free electrons on the elastic constants cij as function of temperature. Slowness curves are calculated for the bulk acoustic wave modes via solution of the Christoffel equation at several doping levels. Variation with respect to temperature is performed in order to extract the linear temperature coefficient of slowness as function of propagation direction. It is found that n-type doping has the largest effect on the slow shear mode and that temperature stable wave propagation directions exist with doping levels above 1019 cm-3. Comparison to experiment is made via measured temperature coefficients of frequency of square plate resonators vibrating in the Lamé mode which is a pure superposition of shear bulk acoustic waves. Good agreement is found.
Keywords :
acoustic wave propagation; bulk acoustic wave devices; degenerate semiconductors; doping profiles; elastic constants; elemental semiconductors; micromechanical resonators; semiconductor doping; silicon; thermal expansion; Christoffel equation; Keyes theory; Lame mode; MEMS; Si; bulk acoustic wave propagation; degenerate level n-type doping effect; elastic constants; electronic effect; free electrons; linear temperature coefficient; shear mode; single crystal silicon; square plate resonator vibration; temperature function; thermal expansion coefficients; Acoustic waves; Crystals; Doping; Micromechanical devices; Silicon; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium (FCS), 2012 IEEE International
Conference_Location :
Baltimore, MD
ISSN :
1075-6787
Print_ISBN :
978-1-4577-1821-2
Type :
conf
DOI :
10.1109/FCS.2012.6243713
Filename :
6243713
Link To Document :
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