Title :
Tracking and erosion resistance of silicone rubber nanocomposites under positive and negative dc voltages
Author :
Vas, Joseph Vimal ; Venkatesulu, B. ; Thomas, M. Joy
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore, India
Abstract :
ASTM D2303 standard provides a method for evaluating the tracking and erosion resistance of polymeric insulators under ac voltages. In this paper, the above method has been extended for evaluating the performance of the insulators under dc stresses. Tests were conducted on polymeric silicone rubber (SR) insulators under positive and negative dc stresses. Micron sized Alumina trihydrate (uATH) and nano sized Alumina (nALU) were used as fillers in SR matrix to improve the resistance to tracking and erosion. Results suggest that SR composites perform better under negative dc than under positive dc voltages. Eroded mass and leakage current data support the above result. Samples with low concentration of nano alumina fillers performed on par with the samples with large loadings of uATH.
Keywords :
alumina; insulators; leakage currents; nanocomposites; polymers; silicone rubber; ASTM D2303 standard; DC stresses; DC voltage; erosion resistance; leakage current; mass current; micron sized alumina trihydrate; nanoalumina filler; nanosized alumina; polymeric insulator; polymeric silicone rubber insulator; silicone rubber nanocomposite; Degradation; Insulation life; Polymers; Resistance; Rubber; Strontium;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
Conference_Location :
West Lafayette, IN
Print_ISBN :
978-1-4244-9468-2
DOI :
10.1109/CEIDP.2010.5724032
