DocumentCode
2659894
Title
Low-inductance snubber arrays for high-power, high-bandwidth switch-mode amplifiers
Author
Rogers, Daniel J. ; Lakshmanan, Padmavathi
Author_Institution
Sch. of Eng., Cardiff Univ., Cardiff, UK
fYear
2015
fDate
15-19 March 2015
Firstpage
2557
Lastpage
2564
Abstract
This paper presents a low inductance snubber design incorporating a damped DC bus capacitance and multiple RC+RCD cells arranged in two arrays. The design suppresses transient over-voltage peaks seen at the switching transitions in hard-switched, high-frequency switch-mode circuits which are created by an unavoidable interaction between circuit parasitic inductances, IGBT turn-off current slopes and free-wheeling diode reverse recovery currents. The array arrangement allows the use of small surface-mount, ultrafast diodes by enforcing current sharing between many devices. An industrial application example is presented where the snubber design enables an increase in DC bus voltage from 200V to 400V when using 600V Si IGBTs operated at a switching frequency of 75 kHz. Simulation results are presented and compared to experimental measurements to illustrate the operating principle and effectiveness of the array design.
Keywords
amplifiers; snubbers; switched networks; IGBT turn-off current slopes; Si IGBTs; circuit parasitic inductances; damped DC bus capacitance; free-wheeling diode reverse recovery currents; frequency 75 kHz; hard-switched high-frequency switch-mode circuits; high-power high-bandwidth switch-mode amplifiers; low-inductance snubber array design; multiple RC+RCD cells; small surface-mount ultrafast diodes; switching transitions; transient overvoltage peak suppression; voltage 200 V to 600 V; Clamps; Inductance; Insulated gate bipolar transistors; Multichip modules; Snubbers; Switches; Switching frequency; IGBT modules; RC circuits; parasitic inductances; snubbers; surface mounting; switched mode power supplies; switching transients;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
Conference_Location
Charlotte, NC
Type
conf
DOI
10.1109/APEC.2015.7104711
Filename
7104711
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