• DocumentCode
    2660202
  • Title

    A fast semi-numerical technique for the solution of the poisson-boltzmann equation in a cylindrical nanowire

  • Author

    Ramu, Ashok T. ; Anantram, Manjeri P. ; Banerjee, Kaustav

  • Author_Institution
    Dept. of Electrical and Computer Engineering, University of California, Santa Barbara, USA
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Silicon nanowire (SiNW) based devices have aroused great interest since they exhibit high carrier mobilities and sub-threshold slopes close to 69 mV/decade due to good charge control. The charge in the nanowire channel is obtained by solving the Poisson equation self-consistently with the Schroedinger equation. However this is a very computationally expensive process and it is usually preferable to solve for the potential to the first order using only the Poisson equation, and then to make a quantum correction for the charge based on the potential gradient at the surface of the wire. It is the former task, that of solving the non-linear Poisson´s equation within the nanowire, that we address here. The built-in non-linear ODE solver in MATLAB does not converge in most cases because the equation is highly non-linear. Commercial numerical solvers like DESSIS are very accurate but slow. Depending on the grid size, they may take several hours to run.
  • Keywords
    Poisson equation; Schrodinger equation; carrier mobility; elemental semiconductors; nanowires; silicon; Poisson equation; Poisson-Boltzmann equation; Schroedinger equation; Si; carrier mobilities; cylindrical nanowire; nonlinear ODE solver; semi-numerical technique; Circuits; Computer languages; Doping; Educational institutions; Nanoscale devices; Nonlinear equations; Poisson equations; Quantum computing; Silicon; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1892-3
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422448
  • Filename
    4422448