• DocumentCode
    2660428
  • Title

    Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites

  • Author

    Sami, A. ; David, E. ; Fréchette, M.

  • Author_Institution
    Ecole de Technol. Super. (ETS), Montreal, QC, Canada
  • fYear
    2010
  • fDate
    17-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The separation of amorphous and crystalline contributions in diffraction data is a necessary step in the study of the structure of the less-ordered regions and in the calculation of the crystallinity of a HDPE and LDPE/SiO2 nanocomposites. The nanocomposites have been prepared by melt compounding using a twin screw extruder. We suggest here that the diffraction pattern of a nanocomposite with a high degree of crystalline order may be fitted with easily resolvable crystalline peaks, and that the intensity not attributable to the crystalline peaks may be regarded as the amorphous scattering. This amorphous halo can be used as a template in analysing the diffraction patterns of crystalline samples.
  • Keywords
    X-ray diffraction; crystallisation; melt processing; nanocomposites; nanofabrication; silicon compounds; SiO2; X-ray diffraction; amorphous scattering; amorphous-crystalline structures; crystallisation; high density composites; low density composites; melt compounding; nanocomposites; twin screw extruder; Diffraction; Nanocomposites; Nanoparticles; Polymers; Scattering; X-ray diffraction; X-ray scattering; HDPE / LDPE; SiO2; X-ray diffraction; crystallinity; nanocomposites materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
  • Conference_Location
    West Lafayette, IN
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-9468-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2010.5724069
  • Filename
    5724069