• DocumentCode
    2660678
  • Title

    A 2D-non-parabolic six moments model

  • Author

    Vasicek, Martin ; Cervenka, J. ; Wagner, Michael ; Grasser, Tibor

  • Author_Institution
    Inst. for Microelectron., Vienna
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The most accurate way to describe carrier transport is to solve the Boltzmann transport equation (BTE), for instance with the very time consuming Monte-Carlo (MC) technique. On an engineering level however macroscopic transport models are more efficient. Multiplication of the BTE with weight functions, approximation of the scattering integral with a macroscopic relaxation time and integration over k-space yields, for instance, the drift-diffusion model, the energy transport model, and the six moments model. The challenge is to model higher-order transport parameters like the energy relaxation time tau1, the second-order relaxation time tau2, the energy mobility mu1 and the second-order mobility mu2 with as few simplifying assumptions as possible. A good choice is the use of tabulated, data extracted from MC simulations. So far, bulk data has been used to examine higher-order parameters in a device. However, important effects like surface roughness scattering or the quantization in inversion layers are not included in bulk MC-data.
  • Keywords
    Boltzmann equation; Monte Carlo methods; Poisson equation; Schrodinger equation; carrier mobility; diffusion; 2D-nonparabolic six moments model; Boltzmann transport equation; Monte-Carlo technique; Schrodinger-Poisson solver; carrier transport; drift-diffusion model; energy transport model; macroscopic transport models; Educational institutions; Hydrogen; Maxwell equations; Microelectronics; Particle scattering; Quantization; Rough surfaces; Sliding mode control; Surface roughness; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1892-3
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422480
  • Filename
    4422480