Title :
Technical challenges in commercial SiC power MOSFETs
Author_Institution :
Cree Inc., Durham
Abstract :
SiC power DMOSFETs offer significant reduction in switching and conduction losses over silicon IGBTs in the 1200 V or higher voltage range. However there are significant challenges in commercializing SiC power DMOSFETs. Some of these challenges will be discussed in this paper. A typical forward characteristics of a 1200 V SIC DMOSFET at 25degC are shown. The active area of this chip is 10.05 mm2 and the on-resistance with a gate voltage of 15 V is approximately 100 mohm. Therefore the specific on-resistance is about 10 mohm-cm2. The threshold voltage, VT, is approximately 3 V measured at 1 mA and VDS = 10 V. The VT will reduce to approximately 1.5 V at a junction temperature of 150degC which is too low to reliably keep the device in off state with VGS = 0 V. Fig. 2 shows the variation of RDSON with temperature the RDSON reduces with increasing temperature (25-50degC) due to the improvement in the effective inversion layer electron mobility. This presents a significant challenge for paralleling these devices.
Keywords :
power MOSFET; silicon compounds; wide band gap semiconductors; SiC; conduction loss; current 1 mA; effective inversion layer electron mobility; power DMOSFET; power MOSFET; silicon IGBT; specific on-resistance; switching loss; temperature 150 C; temperature 25 C; threshold voltage; voltage 1.5 V; voltage 10 V; voltage 1200 V; voltage 15 V; Annealing; Commercialization; Electron mobility; Insulated gate bipolar transistors; MOSFETs; Oxidation; Silicon carbide; Switching loss; Temperature; Threshold voltage;
Conference_Titel :
Semiconductor Device Research Symposium, 2007 International
Conference_Location :
College Park, MD
Print_ISBN :
978-1-4244-1892-3
Electronic_ISBN :
978-1-4244-1892-3
DOI :
10.1109/ISDRS.2007.4422481