Title :
Medium-Voltage Power Conversion Systems in the Next Generation
Author :
Akagi, Hirofumi ; Inoue, Shigenori
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol.
Abstract :
This paper describes the next-generation medium-voltage power conversion systems characterized by using bidirectional isolated dc/dc converters. A 350-V, 10-kW and 20-kHz dc/dc converter is designed, constructed and tested as a core circuit of the medium-voltage power conversion systems. It consists of two single-phase full-bridge converters with the latest trench-gate Si-IGBTs and a 20-kHz transformer with a nano-crystalline soft-magnetic material core and litz wires. The transformer plays an essential role in achieving galvanic isolation between the two full-bridge converters. The overall efficiency from the dc-input to dc-output terminals is accurately measured to be as high as 97%, excluding gate drive circuit and control circuit losses from the whole loss. Moreover, loss analysis clarifies that the use of SiC-based power devices may bring a significant reduction in conducting and switching losses to the dc/dc converter. As a result, the overall efficiency may reach 99% or higher
Keywords :
DC-DC power convertors; high-frequency transformers; power semiconductor switches; power transformers; silicon compounds; soft magnetic materials; 10 kW; 20 kHz; 350 V; Si-IGBT trench-gate; SiC; SiC-based power device; bidirectional isolated dc-dc converter; conducting losses; control circuit loss; dc-input terminal; dc-output terminal; galvanic isolation; gate drive circuit; high frequency transformer; litz wires; medium-voltage power conversion system; nanocrystalline soft-magnetic material core; single-phase full-bridge converter; switching losses; Circuit testing; DC-DC power converters; Galvanizing; Loss measurement; Medium voltage; Nanostructured materials; Power conversion; System testing; Transformer cores; Wires;
Conference_Titel :
Power Electronics and Motion Control Conference, 2006. IPEMC 2006. CES/IEEE 5th International
Conference_Location :
Shanghai
Print_ISBN :
1-4244-0448-7
DOI :
10.1109/IPEMC.2006.4777943
