DocumentCode
2660957
Title
Silicon nanowire fabrication using novel hydrogenation-assisted deep reactive ion etching
Author
Sammak, Amir ; Azimi, Soheil ; Mohajerzadeh, Shams ; Khadem-Hosseini, Bahar ; Fallah-Azad, Babak
Author_Institution
Univ. of Tehran, Tehran
fYear
2007
fDate
12-14 Dec. 2007
Firstpage
1
Lastpage
2
Abstract
A novel method for the fabrication of silicon nanostructures on silicon substrates is reported. This technique relies on a hydrogenation-assisted high aspect ratio plasma etching of silicon substrates capable of producing nanowires and microstructures. The deep vertical etching process consists of sequential oxygen-passivation and SF6-etching of silicon at a record low density plasma of 0.25-0.5W/cm2 (150-300W over an area of 20X30 cm2). A concurrent hydrogenation has been used to stimulate the vertical removal of the silicon substrate without damaging the sidewalls. These nanowires are being used for the fabrication of ultra-small vertical MOSFET transistors provided a sequential doping and etching is used to form the source and drain regions and the gate channel.
Keywords
MOSFET; hydrogenation; nanowires; passivation; silicon; sputter etching; deep vertical etching process; high aspect ratio plasma etching; hydrogenation-assisted deep reactive ion etching; power 150 W to 300 W; sequential doping; sequential oxygen-passivation; silicon nanostructures; silicon nanowire fabrication; silicon substrates; ultra-small vertical MOSFET transistors; Annealing; Educational institutions; Etching; Fabrication; Hydrogen; Nanostructures; Nickel; Plasma applications; Silicon; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2007 International
Conference_Location
College Park, MD
Print_ISBN
978-1-4244-1892-3
Electronic_ISBN
978-1-4244-1892-3
Type
conf
DOI
10.1109/ISDRS.2007.4422497
Filename
4422497
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