• DocumentCode
    2660957
  • Title

    Silicon nanowire fabrication using novel hydrogenation-assisted deep reactive ion etching

  • Author

    Sammak, Amir ; Azimi, Soheil ; Mohajerzadeh, Shams ; Khadem-Hosseini, Bahar ; Fallah-Azad, Babak

  • Author_Institution
    Univ. of Tehran, Tehran
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A novel method for the fabrication of silicon nanostructures on silicon substrates is reported. This technique relies on a hydrogenation-assisted high aspect ratio plasma etching of silicon substrates capable of producing nanowires and microstructures. The deep vertical etching process consists of sequential oxygen-passivation and SF6-etching of silicon at a record low density plasma of 0.25-0.5W/cm2 (150-300W over an area of 20X30 cm2). A concurrent hydrogenation has been used to stimulate the vertical removal of the silicon substrate without damaging the sidewalls. These nanowires are being used for the fabrication of ultra-small vertical MOSFET transistors provided a sequential doping and etching is used to form the source and drain regions and the gate channel.
  • Keywords
    MOSFET; hydrogenation; nanowires; passivation; silicon; sputter etching; deep vertical etching process; high aspect ratio plasma etching; hydrogenation-assisted deep reactive ion etching; power 150 W to 300 W; sequential doping; sequential oxygen-passivation; silicon nanostructures; silicon nanowire fabrication; silicon substrates; ultra-small vertical MOSFET transistors; Annealing; Educational institutions; Etching; Fabrication; Hydrogen; Nanostructures; Nickel; Plasma applications; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1892-3
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422497
  • Filename
    4422497