Title :
An on-die all-digital delay measurement circuit with 250fs accuracy
Author :
Mansuri, Mozhgan ; Casper, Bryan ; O´Mahony, Frank
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
This paper demonstrates an in-situ delay measurement circuit which precisely characterizes key clocking circuits such as full phase rotation interpolators. This on-die all-digital circuit produces a digital output value proportional to the relative delay between two clocks, normalized to the clock period. This circuit requires no calibration for variation or process, voltage, temperature (PVT) and measures the delay with 250fs absolute accuracy and repeatability of 10fs-rms.
Keywords :
clocks; delay circuits; digital circuits; clocking circuit; digital output; full phase rotation interpolator; in-situ delay measurement circuit; on-die all-digital delay measurement circuit; time 250 fs; Accuracy; Clocks; Delay; Delay lines; Density measurement; Frequency measurement; Phase measurement; DCO; clock; delay; phase interpolator; skew;
Conference_Titel :
VLSI Circuits (VLSIC), 2012 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4673-0848-9
Electronic_ISBN :
978-1-4673-0845-8
DOI :
10.1109/VLSIC.2012.6243808
