DocumentCode :
2661576
Title :
A reliable architecture for networks under stress
Author :
Weichenberg, Guy E. ; Chan, Vincent W S ; Médard, Muriel
Author_Institution :
Lab. for Inf. & Decision Syst., Massachusetts Inst. of Technol., USA
fYear :
2003
fDate :
19-22 Oct. 2003
Firstpage :
263
Lastpage :
271
Abstract :
In this paper, we consider Harary graphs as candidate solutions for the design of a physical network topology that achieves a high level of reliability using unreliable network elements. Our network model, which is motivated by the use of all-optical networks for high-reliability applications, is one in which nodes are invulnerable and links are subject to failure in a statistically independent fashion. Our reliability metrics are the all-terminal connectedness measure and the less commonly considered two-terminal connectedness measure. We compare in the low and high stress regimes common commercial architectures designed for all-terminal reliability in the low stress regime with the Harary graph architecture. We focus on Harary graphs as candidate topologies, as they have been shown to possess attractive reliability properties, and we derive new results for this family of graphs.
Keywords :
graph theory; local area networks; network topology; optical communication; Harary graphs; all-optical networks; candidate topologies; local area networks; network design; network topology; reliable network architecture; Aircraft; All-optical networks; Costs; Network topology; Optical fiber LAN; Optical fiber networks; Optical transmitters; Stress; Telecommunication network reliability; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design of Reliable Communication Networks, 2003. (DRCN 2003). Proceedings. Fourth International Workshop on
Print_ISBN :
0-7803-8118-1
Type :
conf
DOI :
10.1109/DRCN.2003.1275365
Filename :
1275365
Link To Document :
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