DocumentCode :
2661675
Title :
Noise and THz rectification characteristics of zero-bias quantum tunneling Sb-heterostructure diodes
Author :
Luukanen, Arttu ; Grossman, Erich N. ; Moyer, Harris P. ; Schulman, Joel N.
Author_Institution :
National Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2004
fDate :
4-6 Aug. 2004
Firstpage :
40
Lastpage :
45
Abstract :
The Sb-heterostructure quantum tunneling diode, fabricated from epitaxial layers of InAs and AlGaSb, is a recently proposed device for direct detection and mixing in the submillimeter wavelength range. These diodes exhibit especially high curvature in the current-voltage characteristic that produces the rectification or mixing without bias. Operation without bias is a highly desirable feature as the device does not suffer from large 1/f noise, a major shortcoming in other devices such as Schottky barrier diodes or resistive room temperature bolometers. In this paper we present the noise characteristics of the diode as a function of the bias voltage. At room temperature and zero bias, the device demonstrates a Johnson noise limited intrinsic noise equivalent power of 1 pW/Hz12 /. In addition to the noise measurements, we present the detection characteristics of the diode at a frequency of 2.5 THz. The measured THz laser response deviates from conventional theoretical prediction based on pure rectification. The reasons for the discrepancy will be discussed.
Keywords :
1/f noise; III-V semiconductors; aluminium compounds; electric noise measurement; epitaxial layers; gallium compounds; indium compounds; quantum interference devices; semiconductor device noise; submillimetre wave diodes; tunnel diodes; 1/f noise; 2.5 THz; AlGaSb; InAs; Johnson noise; THz rectification characteristics; current-voltage characteristic; epitaxial layers; noise characteristics; noise measurements; submillimeter wavelength range; zero-bias quantum tunneling SB-heterostructure diodes; Acoustical engineering; Bolometers; Current-voltage characteristics; Epitaxial layers; Noise measurement; Schottky barriers; Schottky diodes; Temperature; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Devices, 2004. Proceedings. IEEE Lester Eastman Conference on
Print_ISBN :
981-256-196-X
Type :
conf
DOI :
10.1109/LECHPD.2004.1549669
Filename :
1549669
Link To Document :
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