• DocumentCode
    2661675
  • Title

    Noise and THz rectification characteristics of zero-bias quantum tunneling Sb-heterostructure diodes

  • Author

    Luukanen, Arttu ; Grossman, Erich N. ; Moyer, Harris P. ; Schulman, Joel N.

  • Author_Institution
    National Inst. of Stand. & Technol., Boulder, CO, USA
  • fYear
    2004
  • fDate
    4-6 Aug. 2004
  • Firstpage
    40
  • Lastpage
    45
  • Abstract
    The Sb-heterostructure quantum tunneling diode, fabricated from epitaxial layers of InAs and AlGaSb, is a recently proposed device for direct detection and mixing in the submillimeter wavelength range. These diodes exhibit especially high curvature in the current-voltage characteristic that produces the rectification or mixing without bias. Operation without bias is a highly desirable feature as the device does not suffer from large 1/f noise, a major shortcoming in other devices such as Schottky barrier diodes or resistive room temperature bolometers. In this paper we present the noise characteristics of the diode as a function of the bias voltage. At room temperature and zero bias, the device demonstrates a Johnson noise limited intrinsic noise equivalent power of 1 pW/Hz12 /. In addition to the noise measurements, we present the detection characteristics of the diode at a frequency of 2.5 THz. The measured THz laser response deviates from conventional theoretical prediction based on pure rectification. The reasons for the discrepancy will be discussed.
  • Keywords
    1/f noise; III-V semiconductors; aluminium compounds; electric noise measurement; epitaxial layers; gallium compounds; indium compounds; quantum interference devices; semiconductor device noise; submillimetre wave diodes; tunnel diodes; 1/f noise; 2.5 THz; AlGaSb; InAs; Johnson noise; THz rectification characteristics; current-voltage characteristic; epitaxial layers; noise characteristics; noise measurements; submillimeter wavelength range; zero-bias quantum tunneling SB-heterostructure diodes; Acoustical engineering; Bolometers; Current-voltage characteristics; Epitaxial layers; Noise measurement; Schottky barriers; Schottky diodes; Temperature; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Devices, 2004. Proceedings. IEEE Lester Eastman Conference on
  • Print_ISBN
    981-256-196-X
  • Type

    conf

  • DOI
    10.1109/LECHPD.2004.1549669
  • Filename
    1549669