• DocumentCode
    2661819
  • Title

    x11 performance increase, x6.9 endurance enhancement, 93% energy reduction of 3D TSV-integrated hybrid ReRAM/MLC NAND SSDs by data fragmentation suppression

  • Author

    Fujii, Hiroki ; Miyaji, Kousuke ; Johguchi, Koh ; Higuchi, Kazuhide ; Sun, Chao ; Takeuchi, Ken

  • Author_Institution
    Dept. Electr. Eng. & Inf. Syst., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2012
  • fDate
    13-15 June 2012
  • Firstpage
    134
  • Lastpage
    135
  • Abstract
    A 3D through-silicon-via (TSV) -integrated hybrid ReRAM/multi-level-cell (MLC) NAND solid-state drives´ (SSDs´) architecture is proposed for PC, server and smart phone applications. NAND-like interface (I/F) and sector-access overwrite policy are proposed for the ReRAM. Furthermore, intelligent data management algorithms are proposed. The proposed algorithms suppress data fragmentation and excess usage of the MLC NAND by storing hot data in the ReRAM. As a result, 11 times performance increase, 6.9 times endurance enhancement and 93% write energy reduction are achieved compared with the conventional MLC NAND SSD. Both ReRAM write and read latency should be less than 3μs to obtain these improvements. The required endurance for ReRAM is 105. 3D TSV interconnects reduce the energy consumption by 68%.
  • Keywords
    NAND circuits; integrated circuit interconnections; random-access storage; three-dimensional integrated circuits; 3D TSV interconnects; 3D TSV-integrated hybrid ReRAM; 3D through-silicon-via; MLC NAND SSD; NAND-like interface; PC; data fragmentation suppression; endurance enhancement; energy consumption; intelligent data management algorithms; multilevel-cell NAND solid-state drive architecture; read latency; sector-access overwrite policy; server; smart phone; write energy reduction; Current measurement; Flash memory; Heuristic algorithms; Random access memory; Servers; Through-silicon vias; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits (VLSIC), 2012 Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4673-0848-9
  • Electronic_ISBN
    978-1-4673-0845-8
  • Type

    conf

  • DOI
    10.1109/VLSIC.2012.6243826
  • Filename
    6243826