DocumentCode :
2661843
Title :
Low-Capacitance Integrated Silicon Finger Photodetector
Author :
Gaberl, W. ; Zimmermann, H.
Author_Institution :
Inst. of Electr. Meas. & Circuit Design, Vienna Univ. of Technol.
fYear :
2006
fDate :
13-15 Sept. 2006
Firstpage :
122
Lastpage :
124
Abstract :
Results of a low capacitance design for integrated silicon photodiodes are presented. The diodes use n+-doped finger cathodes as well as p+-fingers. With this design it is possible to lower the capacitance compared to homogenous photodiodes (vertical PIN photodiode structure). Low capacitances are reached even at low bias voltages of around 2 V. The diodes reach a responsivity of R=0.24A/W (0.45A/W) at a wavelength of 410 nm (660 nm). The diode design aims at applications where maximum sensitivity, i.e. lowest noise, and therefore low photodiode capacitance is needed. The photodiodes were realized in a 0.6mum BiCMOS process
Keywords :
BiCMOS integrated circuits; integrated optoelectronics; p-i-n photodiodes; photodetectors; 0.6 micron; 410 nm; BiCMOS process; PIN-technology; integrated optoelectronics; low-capacitance integrated silicon photodiodes; n+-doped finger cathodes; p+-doped finger cathodes; photodetectors; Capacitance; Diodes; Fingers; Optical amplifiers; Optical noise; Optical receivers; Optical sensors; Photodetectors; Photodiodes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Group IV Photonics, 2006. 3rd IEEE International Conference on
Conference_Location :
Ottawa, Ont.
Print_ISBN :
1-4244-0096-1
Type :
conf
DOI :
10.1109/GROUP4.2006.1708186
Filename :
1708186
Link To Document :
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