Title :
A clock jitter reduction circuit using gated phase blending between self-delayed clock edges
Author :
Niitsu, Kiichi ; Harigai, Naohiro ; Hirabayashi, Daiki ; Oki, Daiki ; Sakurai, Masato ; Kobayashi, Osamu ; Yamaguchi, Takahiro J. ; Kobayashi, Haruo
Author_Institution :
Gunma Univ., Kiryu, Japan
Abstract :
A clock jitter reduction circuit is presented that exploits the phase blending technique between the uncorrelated clock edges that are self-delayed by multiples of the clock cycle, nT. By blending uncorrelated clock edges, the output clock edges approach the ideal timing and, thus, timing jitter can be reduced by a factor of √2 per stage. There are three technical challenges to realize this: 1) generating uncorrelated clock edges, 2) phase averaging with small time offset from the ideal center position, and 3) minimizing the error in nT-delay being deviated from ideal nT. The proposed circuit overcomes each of these by exploiting an nT-delay, gated phase blending, and self-calibrated nT-delay elements, respectively. Measurement results with a 180-nm CMOS prototype chip demonstrated an approximately fourfold reduction in timing jitter from 30.2 ps to 8.8 ps in 500-MHz clock by cascading the proposed circuit with four-stages.
Keywords :
CMOS logic circuits; clocks; jitter; CMOS prototype chip; clock cycle; clock jitter reduction circuit; frequency 500 MHz; gated phase blending; ideal timing; phase blending technique; self-calibrated nT-delay element; self-delayed clock edge; time 30.2 ps to 8.8 ps; timing jitter; Bit error rate; Clocks; Delay; Logic gates; Phase measurement; Timing jitter;
Conference_Titel :
VLSI Circuits (VLSIC), 2012 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4673-0848-9
Electronic_ISBN :
978-1-4673-0845-8
DOI :
10.1109/VLSIC.2012.6243830