Title :
Pilot-symbol aided channel estimation in spatially correlated multiuser MIMO-OFDM channels
Author :
Wang, Junyi ; Araki, Kiyomichi
Author_Institution :
Graduate Sch. of Sci. & Eng., Tokyo Inst. of Technol., Japan
Abstract :
We address pilot-symbol aided up-link channel estimation for spatially correlated multiuser MIMO-OFDM systems. A novel pilot-symbol pattern is firstly proposed for this multiuser system in order to overcome the interference from the multiuser multi-antennas. Based on these periodically inserted pilot symbols, the channel responses for the entire OFDM data sequence is reconstructed by using the maximum a posteriori probability (MAP) estimation algorithm, exploiting channel correlation in the time, frequency and space domains, which are obtained from a time-variant frequency-selective Rayleigh fading channel model with multiple clusters and complex direction of arrival (DOA). Results demonstrated that system performance can be greatly improved by considering spatial correlation in MIMO-OFDM systems with the designed pilot sequences and proposed 3D filter.
Keywords :
MIMO systems; OFDM modulation; Rayleigh channels; channel estimation; correlation methods; direction-of-arrival estimation; maximum likelihood estimation; multiuser channels; 3D filter; DOA; MAP estimation algorithm; OFDM data sequence channel responses; channel frequency correlation; channel spatial correlation; channel time correlation; complex direction of arrival; frequency-selective Rayleigh fading channel; maximum a posteriori probability estimation algorithm; multiple clusters; multiuser MIMO-OFDM channels; multiuser multiantenna interference; periodically inserted pilot symbols; pilot-symbol aided channel estimation; pilot-symbol pattern; spatially correlated channels; time-variant fading channel; up-link channel estimation; Channel estimation; Clustering algorithms; Delay estimation; Direction of arrival estimation; Diversity reception; Fading; Frequency estimation; Interference; MIMO; OFDM;
Conference_Titel :
Vehicular Technology Conference, 2004. VTC2004-Fall. 2004 IEEE 60th
Print_ISBN :
0-7803-8521-7
DOI :
10.1109/VETECF.2004.1399912