• DocumentCode
    2662198
  • Title

    Improved modeling of output conductance and cut-off frequency of bipolar transistors

  • Author

    Paasschens, J.C.J. ; Kloosterman, W.J. ; Havens, R.J. ; de Graaff, H.C.

  • Author_Institution
    Philips Res. Lab., Eindhoven, Netherlands
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    62
  • Lastpage
    65
  • Abstract
    The collector epilayer is a crucial element in the behaviour of modern bipolar transistors. Compact models for its description, like the Kull model, are also therefore of crucial importance. We give a Mextram-based improvement to these models for quasi-saturation, and show that the output conductance and the cut-off frequency are much smoother. Apart from ohmic quasi-saturation, we also include velocity saturation, which also leads to quasi-saturation (Kirk effect)
  • Keywords
    bipolar transistors; electric admittance; semiconductor device measurement; semiconductor device models; semiconductor epitaxial layers; Kirk effect; Kull model; Mextram-based model improvement; bipolar transistors; collector epilayer; cut-off frequency; modeling; ohmic quasi-saturation; output conductance; quasi-saturation; velocity saturation; Bipolar transistors; Charge carrier processes; Cutoff frequency; Doping; Kirk field collapse effect; Laboratories; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Bipolar/BiCMOS Circuits and Technology Meeting, 2000. Proceedings of the 2000
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1088-9299
  • Print_ISBN
    0-7803-6384-1
  • Type

    conf

  • DOI
    10.1109/BIPOL.2000.886174
  • Filename
    886174