Title :
Impact wear of electric contact
Author_Institution :
Dept. of Electron. Eng., Xi´´an Jiaotong Univ., China
Abstract :
The impact effect on electrical contact of dry reed relay has been investigated with scanning electron microscopy (SEM), X-ray fluorescence (EDX), and Auger electron spectroscopy (AES) analytical systems. On the basis of experiments, it has been recognized that mechanical impact was a serious problem for this kind of relay contact, SEM, EDX, and AES analysis revealed that considerable damage of the contact zones resulted from the impact action and substantial exchange of material occurred. The contact resistance varied with increase of impact numbers. The results showed that impact action can lead to impact wear, resistance failure, or failures to release (sometimes called sticking) after a relatively small number of operations. A model of impact action was proposed and tested. It was also used to study the processes involved in impacting.<>
Keywords :
Auger effect; X-ray chemical analysis; contact resistance; electrical contacts; impact testing; reed relays; scanning electron microscopy; wear; wear testing; AES; Auger electron spectroscopy; EDX; SEM; X-ray fluorescence; contact resistance; contact zones; damage; dry reed relay; electric contact; exchange of material; failures to release; impact action; impact wear; mechanical impact; model; relay contact; resistance failure; scanning electron microscopy; sticking; Chemical elements; Contact resistance; Electrical resistance measurement; Gold; Polymers; Rough surfaces; Surface cracks; Surface resistance; Surface roughness; Testing;
Conference_Titel :
Electrical Contacts, 1991. Proceedings of the Thirty-Seventh IEEE Holm Conference on
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0231-1
DOI :
10.1109/HOLM.1991.170821
