• DocumentCode
    2662251
  • Title

    Statistical analysis of the UWB channel in an industrial environment

  • Author

    Karedal, Johan ; Wyne, Shurjeel ; Almers, Peter ; Tufvesson, Fredrik ; Molisch, Andreas F.

  • Author_Institution
    Dept. of Electroscience, Lund Univ., Sweden
  • Volume
    1
  • fYear
    2004
  • fDate
    26-29 Sept. 2004
  • Firstpage
    81
  • Abstract
    In this paper, we present a statistical model for the ultra-wideband (UWB) channel in an industrial environment. Based on a set of measurements in a factory hall, we find that the abundance of metallic scatterers causes dense multipath scattering. This can be seen to produce mostly a Rayleigh distributed small-scale fading signal, with only a few paths exhibiting Nakagami distributions. For the power delay profile, we suggest a generalization of the Saleh-Valenzuela model where clusters with different excess delays have different ray power decay constants; the decay constants follow a linear dependence on the delay. This model provides an excellent fit to the measured data. We also note that for non-line-of-sight scenarios at larger distances, several hundred multipath components need to be collected to capture 50% of the available energy.
  • Keywords
    Rayleigh channels; electromagnetic wave scattering; indoor radio; microwave propagation; multipath channels; statistical analysis; ultra wideband communication; 3.1 to 10.6 GHz; Nakagami distributions; Rayleigh distributed small-scale fading signal; Saleh-Valenzuela model; UWB channel; dense multipath scattering; factory hall; industrial environment; metallic scatterers; nonline-of-sight scenarios; power delay profile; ray power decay constants; statistical analysis; Bandwidth; Delay; Frequency measurement; Nakagami distribution; Narrowband; Production facilities; Rayleigh channels; Rayleigh scattering; Statistical analysis; Ultra wideband technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference, 2004. VTC2004-Fall. 2004 IEEE 60th
  • ISSN
    1090-3038
  • Print_ISBN
    0-7803-8521-7
  • Type

    conf

  • DOI
    10.1109/VETECF.2004.1399930
  • Filename
    1399930