DocumentCode :
2662375
Title :
A 61-dB SNDR 700 µm2 second-order all-digital TDC with low-jitter frequency shift oscillators and dynamic flipflops
Author :
Konishi, Toshihiro ; Okuno, Keisuke ; Izumi, Shintaro ; Yoshimoto, Masahiko ; Kawaguchi, Hiroshi
Author_Institution :
Kobe Univ., Kobe, Japan
fYear :
2012
fDate :
13-15 June 2012
Firstpage :
190
Lastpage :
191
Abstract :
We present a small-area second-order all-digital time-to-digital converter (TDC) with two frequency shift oscillators (FSOs) comprising inverter chains and dynamic flipflops featuring low jitter. The proposed FSOs can maintain their phase states through continuous oscillation, unlike conventional gated ring oscillators (GROs) that are affected by transistor leakage. Our proposed FSOTDC is more robust and is eligible for all-digital TDC architectures in recent leaky processes. Low-jitter dynamic flipflops are adopted as a quantization noise propagator (QNP). A frequency mismatch occurring between the two FSOs can be canceled out using a least mean squares (LMS) filter so that second-order noise shaping is possible. In a standard 65-nm CMOS process, an SNDR of 61 dB is achievable at an input bandwidth of 500 kHz and a sampling rate of 16 MHz, where the respective area and power are 700 μm2 and 281 μW.
Keywords :
CMOS digital integrated circuits; flip-flops; jitter; least mean squares methods; oscillators; time-digital conversion; CMOS process; FSOTDC; GRO; LMS filter; QNP; SNDR second-order all-digital TDC; bandwidth 500 kHz; conventional gated ring oscillators; dynamic flipflops; frequency 16 MHz; frequency shift oscillators; gain 61 dB; least mean squares filter; low-jitter frequency shift oscillators; power 281 muW; quantization noise propagator; size 65 nm; small-area second-order all-digital time-to-digital converter; transistor leakage; Least squares approximation; Noise; Noise shaping; Oscillators; Quantization; Time frequency analysis; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits (VLSIC), 2012 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4673-0848-9
Electronic_ISBN :
978-1-4673-0845-8
Type :
conf
DOI :
10.1109/VLSIC.2012.6243854
Filename :
6243854
Link To Document :
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