• DocumentCode
    2662375
  • Title

    A 61-dB SNDR 700 µm2 second-order all-digital TDC with low-jitter frequency shift oscillators and dynamic flipflops

  • Author

    Konishi, Toshihiro ; Okuno, Keisuke ; Izumi, Shintaro ; Yoshimoto, Masahiko ; Kawaguchi, Hiroshi

  • Author_Institution
    Kobe Univ., Kobe, Japan
  • fYear
    2012
  • fDate
    13-15 June 2012
  • Firstpage
    190
  • Lastpage
    191
  • Abstract
    We present a small-area second-order all-digital time-to-digital converter (TDC) with two frequency shift oscillators (FSOs) comprising inverter chains and dynamic flipflops featuring low jitter. The proposed FSOs can maintain their phase states through continuous oscillation, unlike conventional gated ring oscillators (GROs) that are affected by transistor leakage. Our proposed FSOTDC is more robust and is eligible for all-digital TDC architectures in recent leaky processes. Low-jitter dynamic flipflops are adopted as a quantization noise propagator (QNP). A frequency mismatch occurring between the two FSOs can be canceled out using a least mean squares (LMS) filter so that second-order noise shaping is possible. In a standard 65-nm CMOS process, an SNDR of 61 dB is achievable at an input bandwidth of 500 kHz and a sampling rate of 16 MHz, where the respective area and power are 700 μm2 and 281 μW.
  • Keywords
    CMOS digital integrated circuits; flip-flops; jitter; least mean squares methods; oscillators; time-digital conversion; CMOS process; FSOTDC; GRO; LMS filter; QNP; SNDR second-order all-digital TDC; bandwidth 500 kHz; conventional gated ring oscillators; dynamic flipflops; frequency 16 MHz; frequency shift oscillators; gain 61 dB; least mean squares filter; low-jitter frequency shift oscillators; power 281 muW; quantization noise propagator; size 65 nm; small-area second-order all-digital time-to-digital converter; transistor leakage; Least squares approximation; Noise; Noise shaping; Oscillators; Quantization; Time frequency analysis; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits (VLSIC), 2012 Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4673-0848-9
  • Electronic_ISBN
    978-1-4673-0845-8
  • Type

    conf

  • DOI
    10.1109/VLSIC.2012.6243854
  • Filename
    6243854